Thesis Contents

Structural Testing of Integrated Circuits
Using Terminal Characteristics Analysis

Ph.D. Thesis Contents Thesis / Short

Introduction 5 3

Chp. 1 Testing Principles and Methods Used in Electronics 8 4

1.1 Testing problematics 8 4

1.2 Fundamentals on testing 11 4

1.3 In circuit classical testing methods 18 5

1.4 Measurement characteristcs in testing systems 22 6

1.5 Digital integrated circuits (IC) Testing 26 7

1.6 Analog integrated circuits Testing 34 8

1.7 Mixed sygnal integrated circuits Testing 40 9

1.8 Research directions in testing 41 10

Chp. 2 Testing Systems with Personal Computers 43 10

1.1 Data acquisition and processing systems with computers 43 10

1.2 Personal computer parallel port 44 11

1.3 Data acquisition modules for personal computers 47 11

1.4 Acquisition and processing software 50 12

1.5 LabVIEW programming language presentation 55 13

Chp. 3 Parametrical Testing System 59 13

1.1 Wide range current generator 59 14

1.2 Bipolar transistors parametrical tests 66 15

1.3 Experimental testing circuit 68 16

1.4 Programs for system command, data measuring and data display 73 17

1.5 Parametrical test – observations and conclusions 80 18

Chp. 4 Digital to Analog Converters Functional Testing 81 18

1.1 Digital to analog (D/A) converters parameters 81 18

1.2 The interface between acquisition board and the converter under test 83 19

1.3 The control programs for testing system with data acquisition board 85 19

1.4 D/A converters test using the PC standard parallel port 89 21

1.5 A testing system commanded via standard parallel port 90 21

1.6 The parallel port control of the testing system 98 23

1.7 A comparative analysis of the proposed testing methods 107 24

Chp. 5 Integrated Circuits Structural Testing

Using Terminal Characteristics Analisys - Data Acquisition System 107 25

1.1 Current injection and voltage measurement method 110 25

1.2 The block diagram of the terminal characteristics plot system 111 25

1.3 Digitally commanded current generator 113 26

1.4 Signal conditioning circuit 115 27

1.5 The analogical signal validation circuit 118 28

1.6 The control circuit 123 29

Chp. 6 Control and Processing Programs

Used for Structural Testing of Integrated Circuits 128 31

1.1 Programming specifications 128 31

1.2 Data specifications 131 32

1.3 Control programs wrotten in assembly language 143 35

1.4 The Co-ordinating programs 153 36

Chp. 7 Conclusions 156 38

7.1 The analised problematics, proposed and realised solutions 156 38

7.2 Original contributions 161 39

7.3 Research directions in the near future 163 40

Appendix 1. Photos of the realised testing systems 165 41

Appendix 3. Interface displays of the co-ordinating program 179 42

References (selections) 181 43

Summary 45

Curriculum Vitae 48

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	*Ph.D. Thesis Contents*	Thesis /	Short
	Introduction	5	3
Chp. 1	Testing Principles and Methods Used in Electronics	8	4
1.1	Testing problematics	8	4
1.2	Fundamentals on testing	11	4
1.3	In circuit classical testing methods	18	5
1.4	Measurement characteristcs in testing systems	22	6
1.5	Digital integrated circuits (IC) Testing	26	7
1.6	Analog integrated circuits Testing	34	8
1.7	Mixed sygnal integrated circuits Testing	40	9
1.8	Research directions in testing	41	10
Chp. 2	Testing Systems with Personal Computers	43	10
1.1	Data acquisition and processing systems with computers	43	10
1.2	Personal computer parallel port	44	11
1.3	Data acquisition modules for personal computers	47	11
1.4	Acquisition and processing software	50	12
1.5	LabVIEW programming language presentation	55	13
Chp. 3	Parametrical Testing System	59	13
1.1	Wide range current generator	59	14
1.2	Bipolar transistors parametrical tests	66	15
1.3	Experimental testing circuit	68	16
1.4	Programs for system command, data measuring and data display	73	17
1.5	Parametrical test – observations and conclusions	80	18
Chp. 4	Digital to Analog Converters Functional Testing	81	18
1.1	Digital to analog (D/A) converters parameters	81	18
1.2	The interface between acquisition board and the converter under test	83	19
1.3	The control programs for testing system with data acquisition board	85	19
1.4	D/A converters test using the PC standard parallel port	89	21
1.5	A testing system commanded via standard parallel port	90	21
1.6	The parallel port control of the testing system	98	23
1.7	A comparative analysis of the proposed testing methods	107	24
Chp. 5	Integrated Circuits Structural Testing
	Using Terminal Characteristics Analisys - Data Acquisition System	107	25
1.1	Current injection and voltage measurement method	110	25
1.2	The block diagram of the terminal characteristics plot system	111	25
1.3	Digitally commanded current generator	113	26
1.4	Signal conditioning circuit	115	27
1.5	The analogical signal validation circuit	118	28
1.6	The control circuit	123	29
Chp. 6	Control and Processing Programs
	Used for Structural Testing of Integrated Circuits	128	31
1.1	Programming specifications	128	31
1.2	Data specifications	131	32
1.3	Control programs wrotten in assembly language	143	35
1.4	The Co-ordinating programs	153	36
Chp. 7	Conclusions	156	38
7.1	The analised problematics, proposed and realised solutions	156	38
7.2	Original contributions	161	39
7.3	Research directions in the near future	163	40
	Appendix 1. Photos of the realised testing systems	165	41
	Appendix 3. Interface displays of the co-ordinating program	179	42
	References (selections)	181	43
	Summary		45
	Curriculum Vitae		48