Annex 1. Testing system photografies;

Fig. A1.2. The Circuit used for the functional testing of an 8 bit digital to analog converter
(the interface board between the tested converter and the acquisition board).

Fig. A1.3. The structural testing system for integrated circuits
commanded through the parallel interface of a personal computer.

Fig. A1.1. Experimental model of the constant current generator digitally commanded
(mechanical switches were used instead of the analogical ones).